The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2000
Filed:
Aug. 29, 1997
Kenneth Leon Habegger, Naperville, IL (US);
Karen Louise Moeller, Naperville, IL (US);
Ronald Keith Poole, Warrenville, IL (US);
Jaime E Salazar, Warrenville, IL (US);
Mark Roman Sosinski, Downers Grove, IL (US);
Richard Grant Sparber, Wheaton, IL (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
Apparatus and a method for testing tiered digital multiplexing apparatus. To test a primary train of tiered demultiplexers, a data path assurance train of demultiplexers and a selector is used to generate a demultiplexed signal for comparison with a primary demultiplexed signal. To test a primary train of tiered multiplexers, the output of the final multiplexing stage is connected to the input of the data path assurance train of demultiplexers to generate a demultiplexed signal for comparison with a primary input signal to the primary multiplexer train. Advantageously, a simpler, more reliable, and less expensive data path assurance circuit using the same types of components as the primary multiplexers and demultiplexers can be used to detect failures in these primary units as well as the data path assurance circuit.