The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2000

Filed:

Sep. 11, 1997
Applicant:
Inventors:

David Van Loan, Diamond Bar, CA (US);

Gary F St Onge, Ballston Lake, NY (US);

Mark A Swart, Anaheim Hills, CA (US);

Assignee:

Delaware Capital Formation, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324755 ; 324754 ; 324758 ; 324761 ;
Abstract

A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention sheet is positioned below the probe plate in an area of the test pins so that the test probes that extend through the probe plate also extends through the probe retention sheet, the probe retention sheet includes a preformed pattern of openings which are undersized with respect to an outside diameter of the test probes which extend through the pin retention sheet so that the retention sheet naturally applies a compression force around a circumference of the test probes extending through the sheet at a level sufficient to retain the test probes within the test fixture.


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