The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2000
Filed:
Aug. 28, 1992
Leonard F Fiore, Foley, MN (US);
Gregory P Brandl, Holdingford, MN (US);
Allen R Voit, Sauk Rapids, MN (US);
Michael J Krouze, St. Cloud, MN (US);
Other;
Abstract
A quality control apparatus and method are provided for a paper mill. The apparatus includes at least one lab entry station which communicates directly with each laboratory in a paper mill. Information from each laboratory is validated by the lab entry station. The apparatus also includes a gateway entry station which receives information from on-line systems in the paper mill and reformats the received information into a single useable format. A global data base manager communicates with the lab entry station and the gateway entry station identifies each bit of information received and assigns addresses for the identified information. A communication manager is provided to transmit the received information from the global data base manager to operator stations. Operator stations provide user interfaces throughout the paper mill at which data can be displayed and analyzed. In this manner various locations throughout a paper mill can assess their own ability to conform to specifications and operational standards. Additionally, at least selected locations in the paper mill can assess the impact of performance at one location in the paper mill on results at other locations.