The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2000

Filed:

Aug. 27, 1998
Applicant:
Inventor:

Yael Almog, Rosh Haiyin, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600300 ; 128898 ; 600301 ;
Abstract

System and screening method for determining characteristics of placenta and fetus in pregnant woman by using system identification techniques to determine whether a fetus is at immediate risk or should enter a high risk pregnancy follow-up. In particular, a system which is a combination of non invasive detectors for the acquisition of physiological signals, a procedure for synchronizing the acquired maternal and fetal signals, and algorithms developed for system identification of biological open-loop systems are employed. The maternal-fetal system has a purely causal relationship between input and output, connected by the placenta. Hence, the identification and modeling of the system reflect the interconnection relations.


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