The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2000
Filed:
Aug. 13, 1997
James Edward Boyette, Jr, Delray Beach, FL (US);
Robert Edward Brown, Boca Raton, FL (US);
Christian J Bunker, Boynton Beach, FL (US);
James Christopher Mahlbacher, Lake Worth, FL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A dual contact probe tip is provided within a flying probe circuit tester to make separate electrical contacts with a circuit under test at two closely-spaced test points. The tip includes a mounting block having an attachment section attached to a carriage of the tester and a pair of flexible cantilever sections, with a probe pin extending from a distal end of each of these cantilever sections to make contact with the circuit. One electrical path is established through the conductive mounting block and one of the probe pins. The other probe pin is coated with an insulating material except for its point and for a surface to which a wire is soldered, so that the other electrical path is established through this other probe pin and the attached wire. Each probe pin is tapered toward its point, and the probe pins extend from the mounting block at an oblique angle toward one another.