The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2000
Filed:
Oct. 09, 1997
Jean-Paul Gaffard, Fontainebleau, FR;
Patrick Gosselin, Paris, FR;
Compagnie Industrielle des Lasers Cilas, Paris, FR;
Abstract
A device for determining the phase errors of electromagnetic waves (OE) which are generated by a light source and transmitted by an optical instrument includes a reception system (SM) having at least one measurement plane (PM, PM3, PM4) provided with a plurality of measurement zones (ZM) which can measure the intensity of the received light and a collimation means (L1) for sending to the measurement plane (PM, PM3, PM4) the electromagnetic waves (OE) transmitted by the optical instrument. The device also includes a defocusing system (SD1, SD2) which can send at least one pair of associated planes (P1, P2), which are conjugate with the pupil plane of the optical instrument, to the reception system (SM) for them to be measured, a computation unit (UC) which determines the phase errors on the basis of measurements taken by the reception system (SM) on the associated planes (P1, P2), and a spatial filter (F) which is arranged in the image plane (P1) of the optical instrument, with the spatial filter restricting the area of the light source seen by the reception system (SM) while allowing the spatial spectrum of the phase errors to be transmitted.