The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2000

Filed:

Jan. 13, 1997
Applicant:
Inventors:

Nobuko Yamamoto, Isehara, JP;

Tadashi Okamoto, Yokohama, JP;

Yoshinori Tomida, Atsugi, JP;

Takeshi Miyazaki, Ebina, JP;

Masahiro Kawaguchi, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H / ; C07D / ; C12Q / ;
U.S. Cl.
CPC ...
536 243 ; 549 13 ; 549 28 ; 549356 ; 536 2431 ; 536 2432 ; 536 2433 ; 435-6 ;
Abstract

A stain for a nucleic acid characterized by containing, as an effective component, a pyrylium salt compound having Y as a negative portion and a pyrylium ring or a pyrylium-similar ring, wherein the ring is comprised of X selected from O, S, Se and Te as a hetero atom and has substituents R.sup.1, R.sup.2 and R.sup.3, wherein each of R.sup.1 and R.sup.2 is independently a hydrogen atom, sulfonate group, amino group, substituted or unsubstituted aryl group, etc., R.sup.3 is -A or -L-A, L is -L.sup.1 -, -L.sup.2 -L.sup.3 - or -L.sup.4 -L.sup.5 -L.sup.6 -, and each of L.sup.1 to L.sup.6 is independently --(CH.dbd.CH)--, a divalent group derived from the substituted or unsubstituted aryl group, etc., A is a substituted or unsubstituted aryl group, etc., and Y.sup.- is an anion. A method for detecting a nucleic acid which comprises the steps of reacting a sample with the stain, and then detecting, by an optical means, the double-strand nucleic acid stained with the stain in the case that the double-strand nucleic acid is contained in the sample.


Find Patent Forward Citations

Loading…