The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2000
Filed:
Jul. 08, 1997
Manfred Ueberschar, Nattheim, DE;
Voith Sulzer Papiermaschinen GmbH, Heidenheim, DE;
Abstract
An applicator implement applies liquid or pasty coating medium directly onto a moving layer of material, in particular paper or cardboard. The applicator implement includes a pre-metering device which extends along the width of the moving material layer. The pre-metering device is divided into a number of segments, each of which are in turn associated with at least one actuator that enables the segments to move with respect to the thickness of the material layer in order to shape a desired profile of the pre-metering device. The applicator implement further includes, following along the path of movement of the material layer, a finishing metering device which also extends along the width of the moving material layer, and which is divided into a number of segments, each of which are in turn associated with at least one actuator that enables the segments to move with respect to the thickness of the material layer in order to shape a desired profile of the finishing metering device. The widths of the segments of the pre-metering device and the finishing metering device are identical according to a first embodiment or first base model. According to a second embodiment or second base model, the widths of the segments of the pre-metering device and the finishing metering device are not identical.