The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2000

Filed:

Jun. 26, 1997
Applicant:
Inventors:

Makoto Yoshida, Gamagori, JP;

Munehiro Nakao, Toyokawa, JP;

Nobuo Suzuki, Nukata-gun, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ; 351211 ; 351221 ;
Abstract

An ophthalmic apparatus having measurement device for inspection or measurement, and bringing the measurement device into the predetermined positional relationships relative to an eye to be examined, the ophthalmic apparatus providing a moving device for moving the measurement device relatively to the eye to be examined, an alignment target projecting optical system for projecting plural alignment targets onto the periphery of cornea of the eye to be examined, an alignment target detecting optical system for detecting target images which are formed by projecting the alignment targets, a judging device for judging the alignment condition in vertical and lateral direction based on the number and positional relationships of target images which are detected, and an instruction device for instructing the moving device to move based on the result judged by the judging device.


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