The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Oct. 28, 1998
Applicant:
Inventors:
Wayne Kevin Beebe, Essex Junction, VT (US);
Sally Botala, Westford, VT (US);
Scott Whitney Gould, Burlington, VT (US);
Frank Ray Keyser, III, Colchester, VT (US);
Wendell Ray Larsen, Essex Junction, VT (US);
Ronald Raymond Palmer, Westford, VT (US);
Brian Worth, Milton, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714726 ; 39550017 ;
Abstract
A programmable gate array includes test subsystems for testing various functional subsystems of the programmable gate array. A sequence of test methods, employing the test subsystems, test the functionality of the programmable gate array, taking into account the interdependencies of the various subsystems and accordingly enabling fault isolation therein.