The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Jul. 29, 1997
Richard E Duren, Conroe, TX (US);
Erik A Eriksen, Houston, TX (US);
Eugene Clark Trantham, Houston, TX (US);
Exxon Production Research Company, Houston, TX (US);
Abstract
A method for reconstructing a selected seismic wavefield at a designated common midpoint and offset location from a set of prestack seismic data traces. The method uses actual data traces from other common midpoint and offset locations to reconstruct the selected wavefield at the designated reconstruction location. The method may be used to reconstruct any selected wavefield, including both primary reflection wavefields and secondary wavefields such as water-bottom multiple wavefields, and may be used with both 2-D and 3-D seismic data. If the reconstructed wavefield is a secondary wavefield, it may be subtracted from the prestack seismic data traces to eliminate interference between wavefields. The method may also be used to reconstruct data from missing shots to avoid spatial aliasing problems in other data processing operations.