The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2000

Filed:

Nov. 19, 1997
Applicant:
Inventor:

Frederick J Telewski, Woodinville, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q / ; G01R / ;
U.S. Cl.
CPC ...
455 671 ; 455 671 ; 455 672 ; 455 674 ; 343703 ;
Abstract

A system and method for testing wireless communication devices uses a waveguide designed for operation beyond cutoff for frequencies used by the wireless communication device to be tested. The waveguide has first and second ends with at least an opened first end to permit the easy insertion and removal of the wireless communication device. An antenna located within the waveguide and coupled to an external test system permits wireless communication between the external test system and the wireless communication device when inserted in the waveguide. Radio frequency (RF) signals propagate between the antenna located within the waveguide and the wireless communication device when inserted into the waveguide. The length of the waveguide is designed to provide sufficient attenuation of RF transmissions when measured at the opened end of the waveguide. The opened end of the waveguide advantageously permits the easy insertion and extraction of a wireless communication device while the waveguide dimensions prevent the leakage of RF signals into and out of the waveguide. The external test equipment includes a transmitter and receiver that are designed to operate at frequencies used by the wireless communication device. The system may be used to collect data to analyze the wireless communication device or to collect transmission characteristics to be used to establish a fingerprint for subsequent identification of the wireless communication device. The external test system may operate under control of a processor or a central computer system. Data collected by the external test system may be analyzed by the processor or the central computer system.


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