The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Oct. 14, 1998
Applicant:
Inventor:
Nobuhiko Nakahara, Shizuoka-ken, JP;
Assignee:
Toshiba Tec Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ; H04N / ;
U.S. Cl.
CPC ...
382169 ; 358456 ; 358457 ; 358466 ; 382270 ;
Abstract
In case of subjecting input graduation image data of 8 bits per pixel to multilevel dither processing, to convert them into image data having gradients of 3 bits per pixel on the basis of dither threshold planes, in a combination of threshold arrays extending over the plural dither threshold planes, dither thresholds for raising spatial fre0 quency, as shown in FIG. 8A, are arranged in low density areas of the input graduation image data, and dither thresholds for making spatial frequency lower than that in the low density areas, as shown in FIG. 8C, are arranged in half tone areas and high density areas of the input graduation image data.