The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Mar. 30, 1998
Andreas Brauers, Aachen, DE;
Rudolf Kemner, Eindhoven, NL;
Ulrich Schiebel, Aachen, DE;
Herfried K Wieczorek, Aachen, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
An x-ray examination apparatus comprises an x-ray detector with a sensor matrix for deriving an image signal from an x-ray image. The x-ray detector is provided with a scatter grid having a regular pattern of x-ray attenuating partitions. The spatial resolution of the sensor matrix is such that the size of the smallest detectable detail in the x-ray image is larger than the distance between adjacent partitions. In particular the x-ray detector comprises an x-ray sensitive photoconductor layer for converting x-rays into electric charges, separate sensor elements include respective collecting electrodes and a semiconductor cladding layer being disposed between the photoconductor layer and the collecting electrodes. The semiconductor cladding layer has a substantial lateral electric conductivity. For example, the semiconductor cladding layer is a chlorine doped selenium layer, or a selenium, sulphur or telluride doped lead-oxide layer.