The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
May. 14, 1997
Applicant:
Inventors:
Assignee:
Sony Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348190 ; 348189 ;
Abstract
An image inspection system for inspecting a display screen establishes a plurality of measurement spots on a display screen to be inspected, and measures images at the measurement spots and displays measured results on a monitor display screen. The image inspection system establishes display spots corresponding to the measurement spots on the monitor display screen, changes the positions of the display spots in a highlighted manner depending on the differences between measured values of the measurement spots and preset reference values, and displays measured results by inter-connecting the changed positions of the display spots with line segments.