The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2000

Filed:

Mar. 24, 1998
Applicant:
Inventors:

Tadashi Ohishi, Ibaraki-machi, JP;

Masaaki Hanawa, Hitachinaka, JP;

Susumu Kai, Hitachinaka, JP;

Hiroshi Mitsumaki, Mito, JP;

Hideyuki Yanami, Hitachinaka, JP;

Assignee:

Hitachi Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 65 ; 422 63 ; 436 43 ; 436 47 ; 436 48 ;
Abstract

A sample analysis system includes blood serum analysis units, blood plasma analysis units and urine analysis units which are arranged along a main conveyor line. The width size of each analysis unit on the side along the main conveyor line is the same. Each analysis unit can be removed integral with a sampling line and its rack transfer device from, the main conveyor line. Removed analysis units can be replaced by each other without changing the entry and exit positions for the sample rack. The conveyor line has the same number of line frame segments as the number of the analysis units.


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