The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Jul. 14, 1998
Applicant:
Inventors:
Yoshiei Hasegawa, Kanagawa-ken, JP;
Eichi Osato, Aomori-ken, JP;
Assignee:
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01K / ;
U.S. Cl.
CPC ...
439 73 ; 439 72 ; 324755 ; 324765 ;
Abstract
The connecting apparatus has a plurality of probes, each having a deformed portion, a needle front portion with a tip end to be pressed against an electrode portion of a device to be tested and continuous with the deformed portion, and a needle tail portion continuous with the other end portion of the deformed portion, assembled in parallel into a base plate by assembling equipment with the tail end portions brought into contact with a retraction preventive portion. Thereby, when device to be tested is pressed against the probe, the probe is prevented from retracting according to the curved state of the deformed portion.