The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Sep. 23, 1996
Sang-Hyeon Baeg, Kyungki-do, KR;
Seong-Won Lee, Seoul, KR;
Samsung Electronics Co., Ltd., Kyungki-do, KR;
Abstract
An test circuit and method for testing an integrated device having an embedded function and a built-in test circuit for testing the embedded function. The built-in test circuit provides control signals to the embedded function based upon an internal state of the built-in test circuit. The integrated device is tested by comparing the control signals provided to the embedded function to the desired control signals based upon the internal state of the built-in self test circuit to confirm the proper operation of the built-in self test circuit. The internal state of the built-in test circuit is monitored and the control signals provided to the embedded function are monitored. The monitored signals are compared to an expected signal pattern based upon the monitored internal state of the built-in test circuit. An error signal is generated if the comparison determines that the monitored control signals do not correspond to the expected signal pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile