The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Dec. 15, 1997
Alfons Spies, Seebruck, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A position measuring system that includes a scale graduation and a scanning element, wherein the scanning element moves relative to the scale graduation along a measurement direction so as to generate position-dependent, intensity-modulated output signals. The scanning element includes a dynamic characteristic, which has saturation areas adjoining both sides of an at least partially approximately linear operating area, in which no significantly changed output signal results any more, even when the input signal changes. The scanning gap (d) between the scale graduation and the scanning element is selected in such a way that as the scanning element moves over its entire measurement range a modulation between maximum input signals, which are located in the saturation areas of the dynamic characteristic, takes place. In order to eliminate the distortions of the output signals which usually occur in this modulation area it is furthermore provided to perform signal filtering in order to remove, in particular, the third harmonic from the output signal.