The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2000
Filed:
Apr. 15, 1998
David N Levin, Chicago, IL (US);
Scott Nagle, Oak Park, IL (US);
ARCH Development Corp., Chicago, IL (US);
Abstract
A method and apparatus are provided for acquiring and reconstructing an image. The method includes the steps of obtaining prior knowledge of the image, possibly by coarse sampling of the image and using the obtained prior knowledge of the image to identify relative locations of structures having relatively high contrast edges. The method further includes the steps of prescribing a set of k-space locations based upon the relative locations of the structures in order to achieve comparable eigenvalues of a reconstruction matrix and sampling the k-space at the prescribed k-space locations to obtain k-space sample data. The k-space sample data are decomposed into background data and edge data. The background data are Fourier transformed to reconstruct a background image component. Similarly, subsets of the edge data are Fourier transformed and the reconstruction matrix is used to form a linear combination of these Fourier transformations in order to reconstruct an edge image component. Finally, the background image component and the edge image component are combined to generate a final image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile