The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2000

Filed:

Jul. 24, 1997
Applicant:
Inventors:

Suguru Takishima, Tokyo, JP;

Toshiyuki Kase, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356345 ;
Abstract

An lens evaluating system for evaluating a dual-focus lens is disclosed. The lens evaluating system is provided with an interferometer to form an image of interference fringes and a masking system which masks a part of the image corresponding to a noise component.


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