The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2000

Filed:

May. 19, 1997
Applicant:
Inventors:

Masaru Fujii, Kanagawa, JP;

Satoshi Takemoto, Tokyo, JP;

Tokio Takeuchi, Chiba, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
348180 ; 348180 ; 348189 ; 348190 ; 348807 ;
Abstract

An apparatus for measuring image qualities of a color display unit has an image quality sensor comprising a color video camera for imaging a display screen of the color display unit and a fixed-focus lens combined as an imaging lens with the color video camera. Image qualities of the color display unit are measured based on an image signal generated by the color video camera, and an image signal required to measure the image qualities is generated and supplied to the color display unit.


Find Patent Forward Citations

Fujii, Masaru. (2000). Apparatus for and method of measuring image qualities of color display (U.S. Patent No. 6018361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6018361

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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