The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2000
Filed:
Oct. 17, 1997
Joel P Dunsmore, Sebastopol, CA (US);
Michael S Marzalek, Rohnert Park, CA (US);
Susan D Wood, Santa Rosa, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A measurement method adjusts the IF bandwidth of a network analyzer to increase measurement speed for high dynamic range devices. According to the first preferred embodiment of the present invention, the bandwidth of the IF filter is adjusted for each corresponding measurement sweep of the network analyzer. The forward transmission and reflection characteristics of the device under test are measured using a first IF bandwidth, and the reverse transmission and reflection characteristics of the device are measured using a second IF bandwidth. When high measurement sensitivity of the forward transmission parameter of the high dynamic range device is sought, the first IF bandwidth is selected to be narrower than the second IF bandwidth. When high measurement sensitivity of the reverse transmission parameter of the high dynamic range device is sought, the first IF bandwidth is selected to be wider than the second IF bandwidth. According to the second preferred embodiment of the present invention, the IF bandwidth is adjusted for each separate measurement sweep corresponding to measurement of each of the forward transmission parameter, the reverse transmission parameter, the forward reflection parameter and the reverse reflection parameter.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile