The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2000
Filed:
Aug. 29, 1997
William A Schneider, Jr, Houston, TX (US);
L Don Pham, Houston, TX (US);
James R Myron, Houston, TX (US);
Exxon Production Research Company, Houston, TX (US);
Abstract
Computer-implemented methods of processing seismic data are subjected to quantitative evaluation by a computerized testing procedure. The effect of the data processing software under evaluation on attributes of the seismic data is measured and statistically evaluated. The effect of various user-selectable processing parameters of the software under evaluation is also measured and statistically evaluated. To evaluate the software effect on attributes, an attribute of known content represented by seismic data is selected. The seismic data represented by that attribute is processed by the processing software under evaluation. A test measure of the attribute is recomputed as indicated by the results of the processing. A quantitative statistical analysis of the similarities of the two attributes is then performed. For quality control of parameter estimates, a parameter-sweep test is performed on original data containing known events. An attribute is computed for both the original data and the parameter-sweep test results. Again, quantitative statistical measures of the similarities between the attributes are formed for evaluation purposes.