The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2000

Filed:

May. 04, 1999
Applicant:
Inventors:

Hong-Ki Kim, Seoul, KR;

Duck-Hyung Lee, Kyungki-do, KR;

Chang-Sik Choi, Kyungki-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438592 ; 438589 ;
Abstract

Integrated circuit memory devices are fabricated by fabricating an array of memory cell field effect transistors and peripheral circuit field effect transistors that are spaced-apart from the memory cell transistors, in an integrated circuit substrate. The memory cell transistors include spaced-apart memory cell transistor source and drain regions and a memory cell gate therebetween. The peripheral circuit transistors include spaced-apart peripheral circuit transistor source and drain regions and a peripheral circuit gate therebetween. A silicide blocking layer is formed on the memory cell transistor source and drain regions. The integrated circuit substrate is silicided to thereby form a silicide layer on the memory cell transistor gates, on the peripheral circuit source and drain regions and on the peripheral circuit gates, such that the memory cell transistor source and drain regions are free of the silicide layer thereon. Accordingly, low contact resistance silicide regions may be selectively provided in memory cells without degrading the leakage characteristics thereof.


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