The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2000

Filed:

Sep. 18, 1998
Applicant:
Inventors:

Yuji Noritake, Kanagawa, JP;

Hisako Murobushi, Tokyo, JP;

Hajime Hori, Kitakyushu, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 2335 ; 73 2341 ; 73 3001 ;
Abstract

An environmental air is sucked by the pump with control unit, and organic solvent contained in the environmental air is collected by the absorbent. Organic solvent having passed through the absorbent is detected by the semiconductor gas sensor. If passage of a material to be measured is detected by the semiconductor gas sensor, operation of the pump with control unit is stopped, and the operation for collecting the material is terminated. Then the absorbent is taken out from the collecting tube, the material collected is quantified by means of gas chromatography, and the density is measured. With this configuration, measurement of a density of a material to be measured in a working environment can be executed accurately.


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