The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2000

Filed:

Jan. 27, 1995
Applicant:
Inventors:

Hong Hao, Sunnyvale, CA (US);

Kanti Bhabuthmal, Fremont, CA (US);

Assignee:

Sun Mircosystems, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
713500 ; 39550005 ;
Abstract

A clock generation and control circuit to debug an integrated circuit includes a multiplexer connected to a set of input lines that carry a set of clock signals. The multiplexer selects one of the input lines in response to a select signal generated by a decode circuit. A control circuit provides input signals to the decode circuit. The control circuit specifies a disabled output clock signal in response to a stop signal applied to a single external pin of the integrated circuit. Alternately, the control circuit specifies a disabled output clock signal through a test access port of the integrated circuit. Debug operations are executed while the output clock signal is disabled.


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