The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2000
Filed:
Feb. 05, 1998
Applicant:
Inventors:
Takashi Yamate, Mie, JP;
Shinji Nishikawa, Mie, JP;
Assignee:
Central Glass Company, Ltd., , JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G01J / ;
U.S. Cl.
CPC ...
356394 ; 359559 ; 382211 ;
Abstract
The image quality of a hologram is evaluated by measuring the spacial distributions of luminance of an image reconstructed from the hologram and an object recorded thereon, normalizing the amplitudes of luminance per spacial frequency (which are obtained by Fourier transforms of the spacial distributions measured, respectively) and comparing the amplitudes normalized or obtaining a ratio between the amplitudes normalized.
Yamate, Takashi. (2000). Method and system for evaluating the quality of holograms (U.S. Patent No. 6014219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6014219
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile