The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2000
Filed:
Aug. 28, 1996
Applicant:
Inventors:
Glenn R Fitzgerald, Garland, TX (US);
Eric G Moore, Richardson, TX (US);
Randy L Williams, Denison, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ;
Abstract
A test system (10) is provided that comprises a controller (14) which controls a test head (12) which comprises a pattern sequence controller (16). An integrated circuit (20) is tested through pin cards (18a) through (18n). A test program (32) operating in controller (14) operates to perform both functional and scanning tests on the integrated circuit (20). Scanning tests are provided for set-up, hold, pulse width, and maximum frequency.
Fitzgerald, Glenn. (2000). Method of identifying the point at which an integrated circuit fails a (U.S. Patent No. 6014033). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6014033
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile