The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2000
Filed:
Aug. 07, 1998
Robert James Heideman, Kewaskum, WI (US);
Elmer Gerald Blachowiak, Hubertus, WI (US);
Christopher Brian Smith, Wauwatosa, WI (US);
Stephen Lee Carian, Milwaukee, WI (US);
Brandon Stuart Tarr, Madison, WI (US);
Neil Arthur Duffie, Madison, WI (US);
Michael Harry Predith, Pewaukee, WI (US);
Tower Automotive, Inc., Milwaukee, WI (US);
Abstract
The three dimensional probe device of the present invention is mountable on a working end of a fully automated and articulated robotic arm movable through at least five degrees of axial freedom in a global dimensional reference. The three dimensional probe device comprises a base, a carriage, a probe, a Z axis measuring apparatus and a tilt measuring apparatus. The probe tip contacts the work piece surface to be traced with deflections in the workpiece seam or path resulting in movement of the carriage and probe. The probe includes a plate and a ball which is pivotable in a ball socket portion of the carriage. Movement of the carriage in relation to the base provides measurement data for rotational change in the direction of the workpiece path or seam. Tilting of the probe provides measurement data for translational change in the direction of the workpiece path or seam.