The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2000
Filed:
Mar. 12, 1998
Applicant:
Inventor:
Bernard J Pappert, Austin, TX (US);
Assignee:
Motorola, Inc., Schaumburg, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ;
U.S. Cl.
CPC ...
365200 ; 365201 ; 36523003 ; 365195 ; 36523008 ; 371 225 ; 371 102 ; 371 103 ;
Abstract
A Built-In Self Test (720) generates a BIST FAIL signal when a failure is detected at a specific address within a memory array (110). The address associated with the failure is stored in a latch (210). During normal operation, the address stored in latch (210) is compared to addresses being currently accesses. A HIT signal is generated when a match occurs. The HIT signal disables selection of the defective row in array (110). A redundant row select signal selects the redundant row (112) to replace the defective row.