The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2000
Filed:
Jan. 29, 1997
Dirk K Broddin, Edegem, BE;
Frank A Deschuytere, Beveren, BE;
Robert F Janssens, Geel, BE;
William E Nelson, Dallas, TX (US);
Vadlamannati Venkateswar, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Agfa-Gevaert N.V., , BE;
Abstract
In classic optical rendering systems, the spot, illuminating a microdot on the photosensitive medium, is designed to overlap with neighboring microdots, typically having an overlap of 1.7 times the pitch of the microdots, for a luminous intensity of 1/e.sup.2 the highest intensity. A 'sharp' photosensitive medium, such as a photographic film used in graphical applications, generates a binary circle, obtainable by thresholding. The area of such a circle is too large, which results in higher dot gain. Many systems, such as electrographic systems, do not behave as a 'sharp' medium. If intermediate energy levels are used, in order to obtain continuous tone or multiple density levels, thresholding behavior may be avoided by appropriate choice of energy levels. Such a different sensitometry results in specific requirements for the energy distribution for each microdot. A square shaped uniform energy distribution within the space allotted to each microdot, allows for multiple density levels, without severe sensitometric requirements.