The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2000
Filed:
Feb. 08, 1999
Yuuji Ootake, Kurume, JP;
Kunihiko Tokita, Kasuga, JP;
Takahiro Noda, Kasuga, JP;
Hirosi Murata, Saga-ken, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
In a method of automatic positional alignment of substrate and screen mask in electrical paste screen printing, the coordinates (X1, Y1), (X2, Y2) of points A, B on a substrate 10 are obtained with a first camera, while the coordinates (X3, Y3), (X4, Y4) of points A', B' on a screen mask 33 are obtained with a second camera. Then, the coordinates of the middle point P1 between the points A and B, and the coordinates of the middle point P2 between the points A' and B' are obtained, based on the results of which positional discrepancies .DELTA.X, .DELTA.Y between the substrate 10 and the screen mask 33 in the directions of X and Y are obtained. Subsequently, the substrate 10 is rotated horizontally with the middle points P1 and P2 superposed until a line segment L1 connecting the points A and B coincides with a line segment L2 connecting the points A' and B', as a result of which a positional discrepancy .theta. in the direction of horizontal rotation is obtained. If the positional discrepancies .DELTA.X, .DELTA.Y and .theta. are obtained, the substrate 10 and the screen mask 33 are aligned with each other based on the obtained results of calculation, and then it is judged whether or not the positional alignment is successful after observation of the points A and A'.