The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2000
Filed:
Mar. 20, 1998
Andreas H Hielscher, Brooklyn, NY (US);
Judith R Mourant, Los Alamos, NM (US);
Irving J Bigio, Los Alamos, NM (US);
The Regents of the University of California, Los Alamos, NM (US);
Abstract
An apparatus and method for recording spatially dependent intensity patterns of polarized light that is diffusely backscattered from highly scattering media are described. These intensity patterns can be used to differentiate different turbid media, such as polystyrene-sphere and biological-cell suspensions. Polarized light from a He-Ne laser (.lambda.=543 nm) is focused onto the surface of the scattering medium, and a surface area of approximately 4.times.4 cm centered on the light input point is imaged through polarization analysis optics onto a CCD camera. A variety of intensity patterns may be observed by varying the polarization state of the incident laser light and changing the analyzer configuration to detect different polarization components of the backscattered light. Experimental results for polystyrene-sphere and Intralipid suspensions demonstrate that the radial and azimuthal variations of the observed pattern depend on the concentration, size, and anisotropy factor, g, of the particles constituting the scattering medium. Measurements performed on biological cell suspensions show that intensity patterns can be used to differentiate between suspensions of cancerous and non-cancerous cells. Introduction of the Mueller-matrix for diffusely backscattered light, permits the selection of a subset of measurements which comprehensively describes the optical properties of backscattering media.