The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2000

Filed:

Aug. 27, 1997
Applicant:
Inventors:

Hiroaki Ichikawa, Kanagawa, JP;

Hisashi Kadota, Kagoshima, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257 57 ; 257252 ; 257233 ; 257254 ; 257417 ; 257418 ; 257419 ; 338 99 ;
Abstract

The present invention provides a thin-film semiconductor device suitable for an areal-pressure-distribution detector and the like. The thin-film semiconductor device according to the present invention comprises an insulating substrate 1, and element regions R being integrated and arranged on the substrate in the form of a matrix and each including a set of mutually connected electrode 2 and thin-film transistor 3. Each electrode 2 senses a signal voltage applied from above the element region R. Meanwhile, the thin-film transistor 3 are on/off-controlled in order and detect the signal voltage applied to the corresponding electrodes 2. In each element region, the surface level H1 of the sensitive region SR where the major part of the electrode 2 is formed is higher by .DELTA.H than the surface level H2 of the non-sensitive region NSR where the corresponding thin-film transistor 3 and a wiring pattern 9 are formed.


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