The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
Jan. 13, 1997
Arun Chandra, Austin, TX (US);
John Carl Grzinich, Austin, TX (US);
Manoranjan Kanthanathan, Foster City, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention discloses a system and method to evaluate intrusive repair. The method and system is based on analyzing data from the field and drawing causal diagrams (cause-consequence diagrams). In an aspect of the present invention, a method and system for evaluating intrusive repair for a class of devices comprises providing a threshold time window for analyzing failure data. The system and method further includes utilizing a causal diagram based on the analysis of the failure data for the class of devices to indicate the probability of intrusive repair. In the present invention, two measures are defined to evaluate intrusive repair--intrusivability and one-fixability. Intrusivability is defined as the probability that a repair action will cause a new fault. One-fixability is defined as the probability that the diagnostic process will fix the fault on the first repair attempt. Both of these measures are determined by using the causal diagram in accordance with the present invention.