The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
Dec. 22, 1998
Pierre Breton, Montreal, CA;
Louis Drolet, Sherbrooke, CA;
Thomas Jelonek, Montreal, CA;
Donald Griffin Koch, Burbank, CA (US);
Pierre-Jules Tremblay, Montreal, CA;
Peter Whaite, Montreal, CA;
Deus Ex Machina Inc., Montreal, CA;
Abstract
A method for determining the appearance of an object to be replicated and an apparatus therefor are described herein. The method consists in providing a controlled illumination to illuminate a surface of the object, measuring the object with a CCD camera to collect an image map of a plurality of points on the surface and processing that information to produce an appearance mapping of the object. Calibration of the apparatus is done by measuring calibration patches illuminated with the same illumination. When the apparatus is made in view of replicating the appearance of an object, a comparison can be done by similarly producing an appearance mapping of the replicate and by comparing it to the appearance mapping of the object.