The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
Jul. 01, 1998
Mohamad Sabsabi, Boucherville, CA;
Paolo Cielo, Montreal, CA;
National Research Council of Canada, Ottawa, CA;
Abstract
A method and apparatus for rapid in-situ spectroscopic analysis of unknown heterogeneous materials is disclosed. The apparatus uses a high power pulsed laser whose beam is focused on the material, typically a porous compound of unknown composition such as an amalgamated powder or a mineral sample. The pulsed laser beam vaporizes a small volume of the material and produces a plasma having an elemental composition which is representative of the material composition. The optical emission of the plasma is analyzed with an optical spectrometer. The pulsed spectrum is detected by a gated photodiode array detector or by an array of individually positioned photomultipliers, to detect a background emission and a line emission representative of a given element present in the material. Because such measurements may fluctuate considerably for porous materials due to unpredictable variations of the plasma temperature and the amount of vaporized mass, the signals are normalized by establishing a ratio of the intensity of the signals to that of the background plasma emission.