The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
Mar. 02, 1998
Applicant:
Inventors:
Allen Jett, Austin, TX (US);
Archer R Lawrence, Austin, TX (US);
Assignee:
Tanisys Technology, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324765 ; 324763 ;
Abstract
A system and method for reducing voltage stabilization time in a leakage current test system, and thereby reducing the time for measuring leakage currents in the I/O pins of an IC chip including CMOS DRAMs is disclosed. The method and system of the present invention accelerates leakage current testing time by precharging the capacitance of the I/O pins under test to a voltage near the settled voltage level, before measuring leakage current at the I/O pin contact points of packaged IC chips and assembled IC modules, and indicating when an I/O pin is defective.