The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 1999

Filed:

Aug. 26, 1998
Applicant:
Inventors:

Sang-Jeong Oh, Yongin, KR;

Yong-tak Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438720 ; 216 47 ; 216 51 ; 216 75 ; 216 76 ; 438736 ; 438742 ;
Abstract

A method for etching a metal layer of a semiconductor device is provided. A metal layer formed on a substrate is etched using a hard mask and a mixed etching gas containing chlorine and oxygen in which the ratio of oxygen gas is preferably about 0.5-0.8. Under such conditions, a metal layer pattern of a fine profile is formed. Since the hard mask is thin, it is possible to prevent etch reactants generated in a process of etching the metal layer from being deposited on the side surface of the resultant formed of the metal layer pattern and the hard mask. As a result, no additional processing is required to remove the etch reactants from the side surfaces and the metal layer etching process is simplified.


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