The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
Oct. 10, 1997
Kunihiro Kasai, Kanagawa-ken, JP;
Kabushiki Kaisha Toshiba, Kawasaki-ken, JP;
Abstract
A method for manufacturing a surface mounting type semiconductor device, to prevent a bump from forming on a test pad, by contacting with a probe needle at a die sort test in manufacturing a surface mounting type semiconductor device. A test pad is formed with a layer, made of the same components as a bonding pad, above the major surface of semiconductor substrate, where an IC is formed. A probe needle is applied onto the test pad to carry out a die sort test. Subsequently, for a conforming article, a resist film is patterned by a lithography technique, thus removing only the test pad. A bump is normally formed only on the remaining bonding pad, thereby avoiding a continuity failure at assembly and any unexpected short-circuits during the connection with the wiring.