The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 1999

Filed:

Jun. 05, 1997
Applicant:
Inventors:

Phillip King Parnell, Sr, Jacksonville, FL (US);

Victor Lust, Jacksonville, FL (US);

Michael William Litwin, Jacksonville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36446822 ; 264-25 ;
Abstract

A method for removing and transporting ophthalmic lens fabricating mold sections from a molding device to an inert chamber in a predetermined time, controlled by a central processor, is disclosed. The method includes starting a timer upon opening the molding device and exposing the mold sections; actuating a robotic arm to transport the mold sections from the molding device to an intermediate position using a compound movement; actuating a cam-controlled arm to transport the mold sections from the intermediate position to a pallet held on a conveyor belt at a cam-arm pre-part release location; and releasing the pallet to move on the conveyor belt to the inert chamber for continued transport of mold containing pallets to a treatment or processing facility for producing and/or packaging of the contact lenses. The method also includes raising a nest to receive the mold sections at the intermediate position; and lowering the nest, after transfer thereon of the molded sections from the robotic arm, for transferring the molded sections to the cam-controlled arm. In a racetrack mode, the pallets continue moving into the inert chamber, while the molded sections are discarded. In a sample mode, a sample bin is moved to the discard location to collect a sample of the molded sections.


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