The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 1999
Filed:
May. 20, 1999
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
An apparatus is provided for measuring a contour of a lens-shaped template formed to be fit into a lens frame of an eyeglass frame. The apparatus includes a lens-shaped template holding device (111) for holding a lens-shaped template (112) formed to be fit into a lens frame (LF, RF) of an eyeglass frame (MF), a measurement element (219) for measuring the contour of the lens-shaped template (112) held by the lens-shaped template holding device (111), a measurement starting device (13) for starting the measurement of the lens-shaped template (112) by the measurement element (219), and a measurement element positioning device (700) for positioning the measurement element (219) at a reference point when the measurement starting device (13) starts the measurement element (219) measuring the lens-shaped template (112).