The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 1999
Filed:
Oct. 08, 1997
Applicant:
Inventor:
Toshiyuki Tsujii, Tokyo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714738 ; 714718 ;
Abstract
A semiconductor device testing apparatus for a memory- built-in logic LSI or the like, which has a hardware configuration that test patterns for logic and memory sections of the semiconductor device can be described independently of each other.
Tsujii, Toshiyuki. (1999). Semiconductor device testing apparatus and method for testing memory and (U.S. Patent No. 6006350). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6006350
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