The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1999

Filed:

Sep. 15, 1997
Applicant:
Inventors:

Peter F Lichtenwalner, St. Charles, MO (US);

James P Dunne, Valley Park, MO (US);

Ronald S Becker, St. Louis, MO (US);

Erwin W Baumann, Florissant, MO (US);

Assignee:

McDonnell Douglas Corporation, St. Louis, MO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01H / ;
U.S. Cl.
CPC ...
702 36 ; 702 34 ; 702 35 ; 73583 ; 73579 ;
Abstract

An active damage interrogation (ADI) system (and method) which utilizes an array of piezoelectric transducers attached to or embedded within the structure for both actuation and sensing. The ADI system actively interrogates the structure through broadband excitation of the transducers. The transducer (sensor) signals are digitized and the transfer function of each actuator/sensor pair is computed. The ADI system compares the computed transfer function magnitude and phase spectrum for each actuator/sensor pair to a baseline transfer function for that actuator/sensor pair which is computed by averaging several sets of data obtained with the structure in an undamaged state. The difference between the current transfer function and the baseline transfer function for each actuator/sensor pair is normalized by the standard deviation associated with that baseline transfer function. The transfer function deviation for each actuator/sensor pair is then represented in terms of the number of standard deviations, or sigmas, from the baseline. This statistic, termed the TF Delta, is then processed by a windowed local averaging function in order to reduce minor variations due to random noise, etc. The Windowed TF Delta for each actuator/sensor pair is then integrated over the entire excitation frequency spectrum, to thereby produce the Cumulative Average Delta, which provides a single metric for assessing the magnitude of change (deviation from baseline) of that particular actuator/sensor transfer function. The Cumulative Average Delta (CAD) for each actuator/sensor transfer function provides key, first-level information which is required for detecting, localizing, and quantitatively assessing damage to the structure.


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