The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1999

Filed:

Jul. 17, 1996
Applicant:
Inventors:

Katsuyuki Tanimizu, Tokyo, JP;

Akira Shindo, Atsugi, JP;

Masakatsu Nunotani, Machida, JP;

Tetsuya Yamamoto, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ;
U.S. Cl.
CPC ...
382216 ; 382141 ; 382294 ;
Abstract

The present invention provides an image matching method which allows non-ear image positional shifts to be corrected on a real time basis, and an economical product testing system using this method. A two dimensional test image, consisting of pixels arranged as a matrix of bits distributed in both the vertical direction and the horizontal scanning direction, and an associated reference image are subjected to template matching at a cell matching arithmetic unit for each of line blocks consisting of a plurality of scan lines. The result of the template matching are quantitatively evaluated at an evaluation unit as being good or bad, and positional shifts are sequentially computed according to good evaluation results. Based on the positional shifts thus obtained, the comparative pixel addresses are accordingly corrected before the two images are compared at the comparator.


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