The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1999

Filed:

Sep. 19, 1995
Applicant:
Inventors:

Nobuo Kochi, Tokyo, JP;

Shin-ichi Nakamura, Tokyo, JP;

Hitoshi Otani, Tokyo, JP;

Takayuki Noma, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382190 ; 382199 ;
Abstract

An apparatus is provided for extracting feature information from images of an object. The images of the object include a first in-focus image and a second soft focus image. The apparatus includes an optical system that includes at least one common image forming optical element. The optical system forms the first image and the second image of the object in different focus conditions. A photosensitive sensor converts the first image and the second image formed by the optical system to first and second image signals. An extracting feature device extracts the feature information of the object from a difference between the first image signals and the second image signals.


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