The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 1999
Filed:
Apr. 01, 1996
Paul John Zombo, Cocoa, FL (US);
Der-Yan Frank Roan, Maitland, FL (US);
Siemens Westinghouse Power Corporation, Orlando, FL (US);
Abstract
A system with three parts: a testing apparatus, a computer system, and a communications line between the two. The testing apparatus has a device that emits x-rays into the sample, a device to position the sample relative to the x-rays and an electro-optical x-ray detector for detecting diffracted x-rays. The computer system has a computer, a computer program, a storage device, a database, and monitor or other means of announcing the results of a test. The computer program directs the computer to accept data from the sample testing system concerning the relationships of the devices, the x-rays, and diffracted x-rays. The computer program also directs the computer to compare this data with a database of previously determined relationships and possible diffraction patterns stored in the storage device. Based on the comparison, the computer program directs the computer to announce the results of the comparison via the monitor or other means, thereby revealing the crystallographic grain structures of the sample. The method encompasses positioning the sample in a path of x-rays projecting from an x-ray means, detecting x-rays that are diffracted by the sample with an electro-optical detector, analyzing the data and announcing the crystallographic grain structures of the sample based on the analyzing step.