The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1999

Filed:

Jun. 12, 1998
Applicant:
Inventor:

Hajime Hiroi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H / ;
U.S. Cl.
CPC ...
361103 ; 361115 ;
Abstract

There is provided a cooling system of a semiconductor testing device using a control computer capable of controlling the number of revolutions of a fan so as to obtain proper air-flow corresponding to the heating value for every operating mode of a measuring unit, thereby preventing the power from being wasted and enabling the supervision of the operating modes of the entire system. The cooling system includes a fan which is rotated by a DC motor, a temperature sensor for measuring a temperature of a measuring unit which is cooled by the fan, a control computer for reading temperature information and revolution information. The control computer transmits a control signal for controlling the number of revolutions of the fan to a fan control.multidot.power supply unit for executing optimum control of the number of revolutions of the fan corresponding to heating value for every operating mode of the measuring unit.


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