The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1999

Filed:

Jan. 28, 1999
Applicant:
Inventors:

Jurgen Pensel, Eichberg, CH;

Herbert M Stuttler, Rankweil, AT;

Assignee:

Leica Microsystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359379 ; 359376 ; 2502013 ;
Abstract

The invention concerns a microscope, in particular an operating microscope with an autofocussing system that adjusts focus based on the user's gaze. A sensor tracks pupil position and this information is evaluated to determine a specific area in the user's field of vision to which the user's gaze is directed, and the autofocussing system brings the specific area into focus.


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